| 9030.84.00
|
Other, with a recording device |
|
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
-- |
| 9030.84.00.00
|
Other, with a recording device |
NMB |
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9030.84.00 |
| 9030.89.00
|
Other |
|
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9030.84.00.00 |
| 9030.89.00.10
|
Electrical instruments and apparatus |
- |
|
|
Compare-9030.89.00 |
| 9030.89.00.90
|
Other |
- |
|
|
Compare-9030.89.00.10 |
| 9030.90.00
|
Parts and accessories |
|
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9030.89.00.90 |
| 9030.90.00.00
|
Parts and accessories |
- |
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9030.90.00 |
| 9031.10.00
|
Machines for balancing mechanical parts |
|
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9030.90.00.00 |
| 9031.10.00.00
|
Machines for balancing mechanical parts |
- |
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.10.00 |
| 9031.20.00
|
Test benches |
|
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.10.00.00 |
| 9031.20.00.00
|
Test benches |
- |
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.20.00 |
| 9031.4
|
Other optical instruments and appliances: |
|
|
|
Compare-9031.20.00.00 |
| 9031.41
|
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) |
|
|
|
Compare-9031.4 |
| 9031.41.00
|
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) |
|
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.41 |
| 9031.41.00.00
|
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) |
NMB |
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.41.00 |
| 9031.49
|
Other |
|
|
|
Compare-9031.41.00.00 |
| 9031.49.10
|
Co-ordinate measuring machines |
|
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.49 |
| 9031.49.10.00
|
Co-ordinate measuring machines |
NMB |
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.49.10 |
| 9031.49.90
|
Other |
|
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.49.10.00 |
| 9031.49.90.00
|
Other |
- |
Free |
CCCT, LDCT, GPT, UST, MXT, CIAT, CT, CRT, IT, NT, SLT, PT, COLT, JT, PAT, HNT, KRT, CEUT, UAT, CPTPT, UKT: Free |
Compare-9031.49.90 |
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